We provide expert refurbishment services for the AMAT SEMVision G3/G4 300mm, a high-resolution e-beam defect review system used in advanced process control. Designed for 300mm wafer manufacturing, the SEMVision platform delivers automated defect classification (ADC), precise defect localization, and high-throughput inspection. Ideal for both FEOL and BEOL process monitoring, it enables root-cause analysis and yield improvement by bridging optical inspection with electron-beam level detail. Our services ensure the system is fully restored for high-performance fab operations.