NOVA Scan 300mm
NOVA Scan 300mm
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NOVA Scan 3060
NOVA Scan 3030 CU
Made with their patented, non-contact in-air and in-water thickness measurement technology, the Nova Scan 3060 reduces the need for operator handling or intervention as well as external verification after cleaning and drying.
The 3060 is a capable of measuring and mapping advanced applications within the semiconductor industry down to the 0.09um technology. This allows for semiconductor manufactures to seamlessly upgrade their production lines from 200mm to 300mm.
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